from π―π΅, live in π°π·
Language: π―π΅π¬π§π°π·
PhD (information technology)
Reliability in semiconductor (high end CPU, automotive, foundry, DRAM, NAND Flash, mobile AP), radiation effect, nuclear physics, soft error.
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Invited by: Kazutoshi Kobayashi
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| Day | Followers | Gain | % Gain |
|---|---|---|---|
| September 27, 2023 | 131 | +8 | +6.6% |
| October 21, 2022 | 123 | +1 | +0.9% |
| August 21, 2022 | 122 | +1 | +0.9% |
| July 15, 2022 | 121 | -1 | -0.9% |
| June 08, 2022 | 122 | -1 | -0.9% |
| May 01, 2022 | 123 | +7 | +6.1% |
| March 24, 2022 | 116 | +28 | +31.9% |
| January 25, 2022 | 88 | +11 | +14.3% |
| December 18, 2021 | 77 | +1 | +1.4% |
| November 10, 2021 | 76 | +11 | +17.0% |